C. M. Lai, C. H. Su, K. M. Lin, Analysis of the thermal stress and warpage induced by soldering in monocrystalline silicon cells. Appl. Therm. Eng. 55, 7-16 (2013).
10.1016/j.applthermaleng.2013.02.028I. Tobías, C. del Cañizo, J. Alonso, Crystalline silicon solar cells and modules. Handbook of Photovoltaic Science and Engineering, (John Wiley & Sons, 2nd ed., 2011), pp. 265-313.
10.1002/9780470974704.ch7J. Walter, M. Tranitz, M. Volk, C. Ebert, U. Eitner, Multi-wire interconnection of busbar-free solar cells. Energy Procedia 55, 380-388 (2014).
10.1016/j.egypro.2014.08.109S. Braun, G. Hahn, R. Nissler, C. Pönisch, D. Habermann, The multi-busbar design: An overview. Energy Procedia 43, 86-92 (2013).
10.1016/j.egypro.2013.11.092J. E. Park, W. S. Choi, D. Lim, Cell/module integration technology with wire-embedded EVA sheet. Appl. Sci. 11(9), 4170 (2021).
10.3390/app11094170J. E. Park, W. S. Choi, D. Lim, Multi-wire interconnection of busbarless solar cells with embedded electrode sheet. Energies 14(13), 4035 (2021).
10.3390/en14134035D. Güldali, A. De Rose, M. Mittag, B. Grübel, H. Neuhaus, U. Tetzlaff, Interconnection of low-temperature metallization on silicon solar cells - The role of silver in tin-bismuth-based solder alloys. Sol. Energy Mater. Sol. Cells 285, 113488 (2025).
10.1016/j.solmat.2025.113488A. W. Czanderna, F. J. Pern, Encapsulation of PV modules using ethylene vinyl acetate copolymer as a pottant: A critical review. Sol. Energy Mater. Sol. Cells 43(2), 101-181 (1996).
10.1016/0927-0248(95)00150-6K. Drabczyk, P. Panek, A comparative study of EVA with and without thermal history for different lamination process parameters. Mater. Sci. Eng. B 177(15), 1378-1383 (2012).
10.1016/j.mseb.2012.04.009M. Knausz, G. Oreski, M. Schmidt, P. Guttmann, K. A. Berger, Y. Voronko, G. Eder, T. Koch, G. Pinter, Thermal expansion behavior of solar cell encapsulation materials. Polym. Test. 44, 160-167 (2015).
10.1016/j.polymertesting.2015.04.009J. Y. Hartley, D. C. Miller, S. Uličná, N. Bosco, P. Hacke, Characterization, accelerated life testing, and finite element modeling of low temperature solder wire interconnect degradation mechanisms. Prog. Photovolt. Res. Appl. 33(10), 1139-1153 (2025).
10.1002/pip.70011- Publisher :Korea Photovoltaic Society
- Publisher(Ko) :한국태양광발전학회
- Journal Title :Current Photovoltaic Research
- Volume : 14
- No :3
- Pages :97-102
- Received Date : 2026-08-19
- Revised Date : 2026-09-09
- Accepted Date : 2026-09-09
- DOI :https://doi.org/10.21218/CPR.2026.14.3.097


Current Photovoltaic Research






